Question

Proton-induced X-ray emission (PIXE) has similar analytical possibilities as scanning electron microscope (SEM) analysis, but is better for analyses of
a) small areas of light materials (such as paper, pigments, or soldering of alloys)
b) samples in the form of a prepared or pressed powder or glass pellet
c) alloys and major components of pottery, faience, glass, and glazes
d) all of the above
e) none of the above

Answer

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