Question

The presence or absence of various elements in an artifact may be established by examining the appropriate spectral line of their characteristic wavelengths. Although used in the analysis artifact composition, __________________ has an accuracy level of only about 25%, and has been superseded by ICPS
a) electron probe microanalysis
b) optical emission spectrometry
c) neutron activation analysis
d) electron spin resonance
e) none of the above

Answer

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